KFC/RTGM X-ray Methods for Characterization of Nanomaterials
Lecturer: Jan Filip
Lecture: 1 hour/week + seminar 1 hour/week
Credits: 2
Summer semester
Form of course completion: colloquium
- Introduction to generation of X-rays, nature of X-rays, modification of X-ray beam with respect to its use in instrumental analytical techniques, basics of radiation safety.
- X-ray diffraction on periodic atomic structure, basic overview of crystallography, basics of single-crystal X-ray diffraction, X-ray powder diffraction – theory, instrumentation, sample preparation, evaluation of diffraction patterns, quantitative phase analysis, Rietveld refinement, specifics of nanostructure analysis, high-temperature/low-temperature X-ray diffraction, thin-film analysis, relations to electron and neutron diffraction.
- Small-angle X-ray scattering (SAXS) – theory, instrumentation for inorganic and biological samples, standardization, sample preparation, data evaluation and processing.
- X-ray fluorescent spectroscopy – theory, instrumentation (energy-dispersive, wavelength-dispersive spectrometers), standardization, sample preparation, evaluation of spectra, other applications of fluorescent spectroscopy (microanalysis, portable spectrometers etc.).
- X-ray photoelectron and Auger electron spectroscopy – theory, basic overview of surface analysis, instrumentation, sample preparation, evaluation of spectra, angle-resolve X-ray photoelectron spectroscopy, depth profiling.
- X-ray absorption spectroscopy – theory, instrumentation and modes of measurement (XANES, EXAFS), sample preparation, standardization, evaluation of spectra.
