KEF/MMM Advanced Microscopic Methods

Lecturer: Roman Kubínek
Lecture: 2 hours/week
Credits: 3
Summer semester
Form of course completion: colloquium

• Light microscopy – method of phase contrast, UV and IR microscopy, fluorescent microscopy, polarization microscopy, interference microscopy (Nomarski interference contrastm Hoffman modulation contrast), confocal laser microscopy, optical scanning near-field microscopy.
• Electron microscopy – transmission electron microscopy, scanning electron microscopy, low-voltage electron microscopy, electron microscopy with high resolution, electron microscopy with optional vacuum (biological application).
• Scanning probe microscopy – scanning tunneling microscopy, atomic force microscopy, magnetic force microscopy, electrostatic force microscopy, lateral force microscopy, scanning capacity microscopy, scanning temperature microscopy, scanning optical near-field microscopy, methods related to the group of methods of scanning probe microscopy.